Improved state integrity of flip-flops for voltage scaled retention under PVT variation

Yang, Sheng, Khursheed, Saqib, Al-Hashimi, Bashir M., Flynn, David and Merrett, Geoff V. (2013) Improved state integrity of flip-flops for voltage scaled retention under PVT variation. IEEE Transactions on Circuits and Systems I: Regular Papers, 60, (11), 1-9. (doi:10.1109/TCSI.2013.2252640).